The EDI CON USA Plenary Session will take place on Tuesday, September 20, 2016 in room 302/304 at the Hynes Convention Center from 4:30-6:00PM. Introductory remarks will be given by Ivar Bazzy, President of Horizon House Publications, and EDI CON USA Honorary Chair, Dr. Eli Brookner, retired Raytheon [http://www.ediconusa.com/news/pr_03.asp].
Plenary Keynote Speaker:
Tom Sikina , Raytheon IDS Electrical Design Directorate, Staff Principal Engineering Fellow
“Innovation in Phased Arrays; Past, Present, and Future”
Innovation in phased arrays has followed a number of different directions since its origins, but has consistently offered new insights, and an expanded the vision of the power of human capabilities and understanding in this arena. It is useful to consider the trends and discoveries it has produced; it traces a pathway of human discovery, often with amusing and amazing stories. Many developers have contributed to this expansion, coming from our universities, industry, and a wide range of experimenters. It is difficult to see an end to this progression, other than still new frontiers, simply awaiting our recognition.
Tom Sikina has led phased array efforts on a wide variety of programs and IR&D efforts at Raytheon for many years. These programs include Space Fence, SBX, DDG-1000, AMRF-C, MEADS, Discoverer II, IRIDIUM, CART, and multiple others. IR&D efforts include the SEA super-element, VICTS-1 & 2, and TRACC. His experience with antenna design extends over 35 years, and has been actively involved in phased array design for more than 25 of those years. The author or co-author of multiple company internal technical articles and more than a dozen patents on phased array technology, Tom has been an active supporter of the Raytheon RF symposium, and has taught the internal Phased Array course at Raytheon periodically since 1998.
Plenary Keynote Speaker:
Todd Cutler, Vice President and General Manager, Design and Test Software, Keysight Technologies, Inc.
“The High-Frequency, High-Speed Design Revolution Ahead: Why Your Design and Test Flow Will Soon Be Obsolete”
Without a doubt, electronic design has evolved through the years from something that was once performed on the back of an envelope to a process that now requires many different types of engineers using a range of different Electronic Design Automation (EDA) tools. Today, that design process and the test flow that accompanies it is once again on the cusp of another evolution—one that is being driven by current and emerging trends in high-frequency and high-speed design.
In his keynote, Todd Cutler, vice president and general manager of Keysight Design & Test Software, will discuss these trends and explain how, when coupled with market pressures, they are driving a revolution in the design and measurement industry. Cutler will also detail what this means for next-generation chip/package/board/system design, and paint a picture for what a typical design and test flow will look like in 3, 5, and 10 years. Is your existing flow on the road to becoming obsolete?
Todd began his career as production engineer in the Network Measurements Division (NMD) of the Hewlett Packard Company (HP), working on the team that developed the HP 8510 network analyzer. In 1984, he moved to the Netherlands to become one of the founding employees of the European Marketing Center of the Microwave and Communications Group. In 1986, Todd returned to Santa Rosa to NMD where he helped found the computer-aided-engineering group that eventually became EEsof. After a 5-year assignment in software field sales, Todd returned to the division in 1993, moving to Westlake Village to help integrate the newly-acquired EEsof business into HP.
In 1998, Todd left HP to be CEO of Eagleware Corporation, the EDA company that pioneered the affordable Genesys RF and microwave design software. After Agilent Technologies spun off from HP, Agilent acquired Eagleware in 2005 and Todd rejoined the company. Todd held various positions before coming general manager of Agilent’s EEsof business in 2011. He remained in that role following Keysight’s split from Agilent in 2014. In 2015, Todd expanded his role to lead Keysight’s Software Products Organization.
Todd holds a Bachelor’s degree in Electrical Engineering degree from Georgia Tech, and a Master of Science Electrical Engineering degree from Stanford University.
Plenary Keynote Speaker:
Faride Akretch, Marketing Manager, Rohde & Schwarz, Inc.
“Continue the innovation towards next generation technologies”
It is no news to anyone that the electronics industry is developing at an astounding pace. Be it for communication standards such as 5G or 802.11 with its various amendments, for automotive radar, or for any other leading application, test & measurement generally finds itself at the forefront of that development. Innovations, often with higher speeds, bandwidths, and more complex technologies have to be tested.
In this plenary session we’ll take a look behind the scenes and explore some of the technologies enabling precise measurements. For one of the examples, we’ll have a closer look at resolution, and how to achieve adequate resolution to measure and distinguish small signals in the presence of large ones. A typical application is for switched mode power supplies (SMPS), or when analyzing AM modulated signals. In a different example, we will discuss a new method of measuring phase noise, and where the traditional approach of an analog phase locked loop (PLL) to recover the phase difference between a reference oscillator and the device under test has its limitation.
Faride Akretch is a segment marketing manager for Rohde & Schwarz. In more than 20 years in the industry he has held a variety of positions in Germany, Japan, and the United States, including application engineer, product marketing and business and market development. He holds a master’s in electrical engineering/electronics from the Technical University of Berlin.
Plenary Keynote Speaker:
Jin Bains, Vice President, RF R&D, National Instruments
“Tomorrow's Wireless: How 5G, 802.11ad, and the IoT is Shaping the Future of Wireless Technology”
For an entire decade until about 2015, the volume teenagers downloading goofy cat videos was likely a bigger driver of Wi-Fi and mobile networks than the IoT. In 2016, this is no longer the case. Wireless technology is being shaped by an entirely different set of use cases and market forces. Analysts predict that within the next decade, the number of connected things will outnumber people by about 10x. Connected things have different needs than connected people – and these needs will dramatically shape the future of wireless technology.
In this presentation, we will investigate a handful of the hottest wireless technologies including LTE-M, LTE-Advanced Pro, 5G, 802.11ad, and 802.11ay. In addition to explaining the target use cases and features of these standards – we will also investigate how they change engineering design and test practices. As a result of attending, you will be better equipped to evolve your organization to address the future of wireless design and test.
As vice president of research and development of RF products at National Instruments, Jin Bains leads the continued advancement and growth of NI in the RF and microwave test and design industry.
Bains joined NI in 2006 as director of RF hardware products. Prior to joining NI, Bains worked at Hewlett-Packard and Agilent Technologies in various roles, including R&D project management on RF and baseband test instruments. Bains holds a master’s degree in EE with an emphasis in communications systems from Stanford University and a bachelor’s degree in EE with a focus in RF/microwave circuits from the University of California at Davis.